Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

WILSONVILLE, Ore. and SAN JOSE, Calif. -- August 19, 2009 – Mentor Graphics Corporation (NASDAQ: MENT) and LogicVision, Inc. (NASDAQ: LGVN) today announced that LogicVision stockholders have voted ...

Extending the in‑field life of your silicon is essential for long‑term success and for staying ahead of your competitors in today’s rapidly evolving digital world of data centers, automotive and ...

BANGALORE, INDIA: Magma Design Automation Inc., a provider of chip design software, and LogicVision Inc., a provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, announced that ...