Writing correct concurrent programs is harder than writing sequential ones. This is because the set of potential risks and failure modes is larger - anything that can go wrong in a sequential program ...

It is with regret that we announce that Dr. Grant Boctor, president of Digitaltest, passed away in late March. He died of a sudden heart attack while traveling in Egypt. Dr. Boctor founded Digitaltest ...

Semiconductor manufacturers continue to look for ways to reduce the cost of test for producing mixed-signal SOC and SIP devices. Parallel test strategies, known as multisite test, implemented on ATE ...

System-on-a-chip (SoC) unit volume shipments continue to increase at a faster rate than SoC revenues. This compression results in continued pressure to increase throughput and reduce costs in the area ...

International Test Conference- Santa Clara, CA – Business Wire – October 25th, 2007 — Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE ...

Dave Armstrong, director of business development at Advantest, discusses the usefulness of concurrent test and describes how to maximize the value of this approach.

Integrating plasma next-generation sequencing (NGS) alongside tissue testing when determining lung cancer diagnosis may improve outcomes for patients. Carrying out plasma next-generation sequencing ...