A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. This article dives into the happens-before ...

(Editor's Note: This is the first of a series of articles that will define what is predicted yield improvement and how it can be measured or validated using test data) Design for Yield (DFY) tools are ...

executivebrief.com – Learn how you can solidify your process improvement strategy by collecting vital data at each quality checkpoint. Study these best practices for implementing a program that will ...