The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

• The underlying migration mechanism of Mg 2+ in cathode materials and roles of defects in Mg 2+ migration in cathode materials were studied. • Applications of defect engineering to Mg 2+ migration in ...

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...