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(Nanowerk News) Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, ...

A new publication from Opto-Electronic Advances, 10.29026/oea.2023.230048 discusses an all-fiber ellipsometer for nanoscale dielectric coatings. Measuring the refractive index and the thickness of ...

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Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Accurion EP4, the latest imaging ...

The Film Sense FS-1 Multi-Wavelength Ellipsometer provides fast and reliable thin film measurements using long-life LEDs and a no-moving-parts ellipsometric detector. The film thickness of most ...

The Film Sense FS-1 Multi-Wavelength Ellipsometer provides fast and reliable thin film measurements using long-life LEDs and a no-moving-parts ellipsometric detector. The film thickness of most ...

The ellipsometer is capable of measuring film thicknesses and index of refraction of stacks of thin films including dielectrics.

The department of electronics, Fergusson College, has another feather in its cap to boast of. The department of electronics, Fergusson College, has another feather in its cap to boast of. In one of ...