针对FIB-SEM同步系统中离子束库仑力扩散与样品电荷积累导致的加工精度问题，研究人员开发了动态离子-电子中和器（SIEN）模型，通过GPU加速算法解析三维束流密度分布。实验表明，该模型使硅材料加工精度提升17%（30 pA FIB+5 keV EB），PMMA提升30%（80 pA FIB+3 keV EB ...

东京--(BUSINESS WIRE)--(美国商业资讯)--JEOL Ltd. (TOKYO:6951)（总裁兼首席执行官：Izumi Oi）宣布于2023年2月1日推出FIB-SEM系统“JIB-PS500i”。 随着先进材料结构愈发精细化和工艺愈发复杂化，形态观察、元素分析等评价技术对分辨率和精度提出了更高的要求。在半导体 ...

ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution “see while you mill” capability, providing unmatched feedback for precision endpointing in sample preparation workflows. · GlobeNewswire Inc.

TESCAN SOLARIS 是一款镓离子源的 FIB-SEM 系统，适用于超薄 TEM 样品制备和其它具有挑战性的纳米加工任务，这些任务要求设备具有**的分辨率、***的离子光学系统和**的纳米加工能力。 TESCAN SOLARIS 的 Triglav™ 型 SEM 镜筒具有超高的分辨率，特别是在低电压下；镜筒内 ...

来自前沿领域的研究人员通过低温聚焦离子束-扫描电镜（cryo-FIB-SEM）技术，首次可视化水-四氢呋喃（THF）二元混合物在低温下的双连续相分离结构，发现FIB铣削导致THF富集区显著流失（局部升温约178 K），并揭示电子束诱导COPV2-G1纳米粒子形变与THF分解的耦合 ...

Today's scanning electron microscopes achieve ∼2-nm spot diameters at landing energies low enough that only the top few nanometers of the block's surface contributes substantially to the acquired ...

ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution "see while you mill” capability, providing unmatched feedback for precision endpointing in sample preparation workflows. New ZEISS Gemini 4 ...

New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live SEM imaging extended to monitor rapid FIB milling down to ultrafine lamella polishing Largest undistorted ...

Advances in simultaneous SEM imaging while FIB milling provide unmatched feedback for precision endpointing New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live ...

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