Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...

Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...

Keysight Technologies has introduced a compliance test application for systems using low-power double-data-rate 4 memory. The application gives engineers an efficient and quick way to characterize ...

Autodesk, the software company behind AutoCAD, has teamed up with NASA's Jet Propulsion Laboratory (JPL) to look at news ways to create an interplanetary lander that could potentially touch down on ...