Total reflection X-rays fluorescence (TXRF) is a surface elemental analysis technique often used for the ultra-trace analysis of particles, residues, and impurities on smooth surfaces. Due to its ...

The DeltaVision OMX V4 enables Total Internal Reflection Fluorescence Microscopy (TIRF). This technique uses an evanescent wave to selectively excite fluorophores that are close to the coverslip. This ...