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PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Using commercially available technology and innovative methods, researchers at NBI have pushed the limits of how fast you can detect changes in the sensitive quantum states in the qubit. Their work ...

Abstract: To address the challenges of low detection accuracy and inaccurate localization of certain defects in pipeline internal defect detection. We propose an enhanced deep learning model, ALW-YOLO ...

WILMINGTON, N.C. (WECT) - February is Heart Health Month and next week begins Congenital Heart Defect Awareness Month. Dr. Lance Lewis, a cardiologist with Novant Health, was in the studio to discuss ...

A production-ready AI vision system for real-time defect detection and classification in manufacturing environments. Achieves >95% accuracy with <100ms latency on edge hardware (NVIDIA Jetson, RTX).

The system, developed by Panevo, a Canadian clear technology and manufacturing analytics company, reportedly achieved approximately 97% detection reliability with minimal false positives of Muskoka’s ...

The dataset is already organized in YOLO format in the steel_dataset/ directory. If you need to reorganize from original format, see utility/reorganize_dataset.py. steel-defect-detection/ ├── ...

Abstract: Aiming at the existing PCB defect detection methods that have problems such as low accuracy and more difficult to identify defects, a PCB defect detection algorithm based on improved Yolov8 ...